Test Structures for Characterising the Integration of EWOD and SAW Technologies for Microfluidics.

by Maks Gepner | May 20, 2010 | PDFs

IEEE International Conference on Microelectronic Test Structures 2010
Y. Li, Y. Q. Fu, D. Winters, B. W. Flynn, W. Parkes, D. S. Brodie, Y. Liu, J. G. Terry, L. I. Haworth, A. S. Bunting, J. T. M. Stevenson, S. Smith, L. L. Mackay, P. L. Smith, A. A. Stokes, A. J. Walton